ZEISS Xradia CrystalCT computed tomography platform uniquely augments this powerful imaging technique with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, pharmaceuticals and others) can be studied, leading to newer and deeper insights for your materials research.
Advance materials characterization and discovery through groundbreaking diffraction scanning modes
Perform non-destructive mapping of grain morphology in 3D
Characterize materials such as metals, alloys, and ceramics
Map larger volumes and a wider array of sample geometries at higher throughput
Achieve superior sample representivity
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MC33074DR2G | onsemi | |
RB751G-40T2R | ROHM Semiconductor | |
BD71847AMWV-E2 | ROHM Semiconductor | |
TL431ACLPR | Texas Instruments | |
CDZVT2R20B | ROHM Semiconductor |
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ESR03EZPJ151 | ROHM Semiconductor | |
STM32F429IGT6 | STMicroelectronics | |
TPS63050YFFR | Texas Instruments | |
IPZ40N04S5L4R8ATMA1 | Infineon Technologies | |
BU33JA2MNVX-CTL | ROHM Semiconductor | |
BP3621 | ROHM Semiconductor |
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